JDSU intros fiber inspection and testing solutions

MILPITAS, USA: JDSU has introduced two new fiber inspection and testing tools -- the FVA digital benchtop fiber microscope system for lab and manufacturing segment and the MP Series optical power meter for field test technicians.

Both instruments support the company's Inspect Before You Connect campaign, which is designed to educate customers about the best practices and industry quality standards for improving the speed and efficiency of handling optical connectors.

The new FVA digital benchtop microscope system cuts fiber inspection time in half and provides an objective and repeatable measurement that enables users to ensure standard compliance of their connectors.

The JDSU FVA eliminates operator subjectivity with a fully automated inspection system that quickly and consistently focuses and centers the fiber image. It also locates and counts defects, scratches and evaluates against pass/fail criteria.

The new MP Series OPM is a miniature optical power meter that connects to a PC via a USB 2.0 connection. The MP Series OPM is an innovative alternative for one of the industry's most fundamental optical tools, adding the capability to obtain and record optical power measurements to a PC, laptop, or other JDSU test devices.

The most significant benefit of the MP series optical power meter is realized when it is combined with a JDSU P5000 microscope with pass/fail analysis, enabling technicians to effectively implement a systematic and proactive method for fully documented inspection and test wherever fiber connectivity is handled.

"With these new products, our customers can now ensure and document that they are compliant to industry end face quality standards, such as the pending IEC-61300-3-35," said Jim Nerschook, vice president and general manager in JDSU's Communications Test and Measurement business segment.

"JDSU strives to provide technicians with fast and reliable methods for non-subjective pass/fail image analysis. With the new MP Series OPM, logging optical power measurements, generating summary reports, and archiving information is now a breeze."