Tuesday, October 6, 2009

Tektronix intros precision bench digital multimeters for complex designs

BANGALORE, INDIA: Tektronix Inc. today announced the DMM4000 Series of 5.5 digit and 6.5 digit resolution digital multimeters (DMM) designed to help engineers debug complex electronics and validate circuit design through precision measurements and in-depth analysis capabilities.

In addition, the DMM Series integrates with National Instruments LabVIEW SignalExpress interactive instrument software for quickly acquiring, analyzing, and presenting data from multiple instruments.

With the addition of the DMM4000 Series, Tektronix offers customers an expanded portfolio of powerful bench instruments that can be connected for correlated measurements and data recording offering extended debug capabilities.

As the circuits in embedded system designs become more sophisticated and demand tighter tolerances, engineers need to precisely measure, debug and validate circuits across a wide range of signal types and parameters with a high degree of accuracy. This need is best met with an integrated set of tools including oscilloscopes, signal generators and DMMs that are easy to use, reliable and offer advanced analytical capabilities.

“The new Tektronix DMM family fits well with Tektronix MSO/DPO oscilloscopes, logic analyzers and AFG3000 function generators by offering engineers advanced capabilities and superior ease of use,” said Bob Bluhm, vice president, Value Products and Accessories Product Line, Tektronix.

“As part of the Tektronix intelligent debug strategy, we have worked with National Instruments to ensure the DMM Series is integrated with NI LabVIEW SignalExpress instrument software, in keeping with our other bench products. Now, our customer’s entire Tektronix bench can be connected through one software interface for instrument control, automated measurements, data logging and extensive analysis of correlated signals. This is a breakthrough for today’s engineers who are frustrated by debug of highly complex designs with many signal types.”

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