Friday, December 9, 2011

XRF analysis for RoHS evaluation, counterfeit detection and plating thickness

ST. PETERSBURG, USA: Nasco offers RoHS testing services for restricted substances on all electronic components and aerospace hardware. Frank Bagnasco, president of Nasco added the Oxford Instruments X-Strata 980 to its list of equipment used to not only verify the authenticity of the parts it sells but also offer affordable testing services to companies needing RoHS compliance verification.

Originally used to verify RoHS compliance, XRF analysis is now a useful tool in determining the authenticity of electronic components.

Did you know that with the implementation of the Restriction of Hazardous Substances (RoHS) Directive electronic component manufacturers maintain data that list the elemental composition of their products? Using X-ray fluorescence (XRF) equipment to compare the elemental breakdown of the part being analyzed to the manufacturer’s specifications or a known good device is another vital tool in the combat against counterfeit components!

The X-Strata 980 is unique in that not only does it perform elemental composition analysis; it is capable of measuring the plating thickness of components. This is useful in a number of applications:

Military and Aerospace hardware: Analyzes the plating material and thickness and compare these results to the specification.

RoHS to Sn/Pb (tin/lead) conversion: Tests the plating thickness of parts that have been converted using hot solder dip to replace the finish on electronic components per the GEIA-STD-0006 standard.

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