JAPAN: Advantest Corp. has entered the high-growth market for testing micro-electromechanical system (MEMS)-based sensors by installing V93000 Smart Scale systems at several of Freescale Semiconductor's facilities around the world.
In addition to using Advantest's testers for engineering development at Freescale's Sensor and Actuator Solutions Division engineering center in Tempe, Arizona, the semiconductor manufacturer has started to employ the V93000 platform in production testing of its newest generations of MEMS-based sensors being manufactured in Asia.
Advantest's versatile V93000 Smart Scale platform, equipped with Pin Scale 1600 digital channel cards, can be configured to provide the lowest cost of test for high-volume sensors. While the ultra-compact A-Class test head enables a small footprint, the V93000's robust system resources and its unique, processor-based universal pin architecture combine to deliver unmatched parallelism and high multi-site efficiency in testing all current and emerging sensor technologies.
The tester is equipped with drivers for all major MEMS handlers and can communicate with the handler during the test flow. This is a key performance attribute in testing MEMS, which requires the handler to move between different orientations during test runs.
The Advantest V93000 tester has a successful track record with Freescale. The company contracts with outsource semiconductor assembly and testing (OSAT) facilities throughout Asia that are using V93000 systems.