USA: Anritsu Co. announced that LTE-Advanced Carrier Aggregation (CA) devices are one step closer to commercial deployment with a demonstration of 150 Mb/s data throughput at CTIA2013.
The demonstration will use the new NETGEAR AirCard 780S Mobile Hotspot and Anritsu MD8430A LTE Network Simulator with RTD test sequences. Aggregation of two 2x2 MIMO carriers into one "pipe" will be shown, with data rates faster than most commercial networks currently on the air. Anritsu and NETGEAR will provide the demonstration of LTE-Advanced CA capability in Anritsu's booth (#6123) at CTIA2013.
The NETGEAR AirCard 780S Mobile Hotspot is the first in a series of products currently in development that will support LTE-Advanced CA technology. LTE-Advanced CA is an important advancement that allows wireless service providers to harness fragmented spectrum resources to provide unmatched speed and coverage benefits to LTE subscribers.
The MD8430A LTE Network Simulator can simulate up to two active and four interfering LTE base stations on up to four RF channels. A mix of Frequency Division Duplex (FDD) and Time Division Duplex (TDD) base stations can be simulated, with multiple MIMO configurations possible for each base station, including SISO, 2x2 MIMO or 4x2 MIMO.
A full lineup of advanced Rel. 8, 9, and 10 features are available, including Carrier Aggregation, Dual-Layer Beamforming, Enhanced Multimedia Broadcast Multicast Service (eMBMS), Robust Header Compression (RoHC), Semi Persistent Scheduling (SPS), and others. The MD8430A is a building block for Anritsu's LTE Conformance and Carrier Acceptance Test (CAT) solutions, including the ME7873L LTE RF Conformance Test System and ME7834L Mobile Device Test System.
The MX786201A RTD scripting software gives users the power to create tests that cannot be done with traditional language-based tools. RTD supports testing at multiple layers in the device stack, with Low-Level Procedure Libraries for early stages of device development, and auto-configuring Layer 3 Procedure Libraries for later stages of device development. Reference Test Cases and Integration Libraries are available to enable building customized test cases and libraries with ease.